The revolutionary impact of cobalt gates in advanced semiconductor technology

Krishnamurthy, Sugirtha (2025) The revolutionary impact of cobalt gates in advanced semiconductor technology. World Journal of Advanced Research and Reviews, 26 (1). pp. 1678-1683. ISSN 2581-9615

[thumbnail of WJARR-2025-1176.pdf] Article PDF
WJARR-2025-1176.pdf - Published Version
Available under License Creative Commons Attribution Non-commercial Share Alike.

Download ( 482kB)

Abstract

The introduction of cobalt gates represents a transformative advancement in semiconductor technology, particularly in advanced process nodes. This innovation addresses critical challenges in device scaling and performance, offering superior electromigration resistance and reduced line resistance compared to traditional metallization schemes. Cobalt gates have revolutionized FinFET architectures, enabling enhanced dimensional scaling while maintaining excellent interface quality and device characteristics. The technology demonstrates significant advantages in artificial intelligence applications and high-speed communications, requiring precise manufacturing controls and quality measures. The implementation of cobalt gates has established new benchmarks in semiconductor fabrication, paving the way for quantum computing applications and next-generation electronic devices while ensuring reliable performance and scalability.

Item Type: Article
Official URL: https://doi.org/10.30574/wjarr.2025.26.1.1176
Uncontrolled Keywords: Cobalt Metallization; Semiconductor Scaling; Finfet Technology; Quantum Computing; Interconnect Reliability
Depositing User: Editor WJARR
Date Deposited: 25 Jul 2025 14:56
Related URLs:
URI: https://eprint.scholarsrepository.com/id/eprint/1863